Judge Takashi Hirose from the Intellectual Property Division of the Tokyo District Court was a Visiting Foreign Judicial Fellow at the FJC in June 2017. Judge Hirose explored different aspects of patent litigation in the United States and met with judges, officials from the Patent and Trademark Office, patent attorneys, and Center staff. His research was undertaken to help the Japanese judiciary evaluate proposed amendments to Japan’s intellectual property legislation. 

Image: District Courthouse, Tokyo, Japan